Structure sensitive factors in molecular cluster formation by ion bombardment of single crystal surfaces

Author:

Winograd Nicholas,Harrison Don E.,Garrison Barbara J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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3. Study of ionization processes during TOF-SIMS analysis by co-sputtering cesium and xenon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-06

4. On the formation mechanism of MCs2+ molecular ions under varying oxygen environment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-05

5. Secondary Ion Mass Spectrometry as Related to Surface Analysis;Encyclopedia of Analytical Chemistry;2006-09-15

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