UV photoemission study of the system Cu on Si(100)2×1
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference22 articles.
1. Combined AES, LEED, SEM and TEM characterizations of CuSi(100) interfaces
2. Formation of noble-metal-Si(100) interfaces
3. Characterization of Cu/Si(100) interfaces by different surface-sensitive techniques
4. H. Kemmann, F. Müller and H. Neddermeyer, Surface Sci., to be published.
5. 7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Initial stages of adsorption in the Cu/Si() system;Surface Science;2002-05
2. Cl2 surface chemistry on Cu/Si(100): an ISS, XPS, and TPD study;Surface Science;2001-03
3. Electronic structure of Cu3Si;Physica B: Condensed Matter;1996-07
4. Investigation of the Si(100)2 × 1/Cu interface by UPS and surface reflectance spectroscopy;Applied Surface Science;1993-03
5. Investigation of Cu/Si(100)2 × 1 by photoemission and surface reflectance spectroscopy;Surface Science;1992-10
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