Characterization of Cu/Si(100) interfaces by different surface-sensitive techniques
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference10 articles.
1. Photoemission investigation of Si(111)–Cu interfaces
2. Similarities in chemical intermixing at the Cu/InP and Cu/Si interfaces
3. The Si(111)/Cu interface studied with surface sensitive techniques
4. Compound formation and bonding configuration at the Si-Cu interface
5. Formation and properties of the copper silicon(111) interface
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1. Scanning tunneling microscopy study of Cu-induced surface restructuring of Si(100)-(2 × 1);Applied Surface Science;2019-06
2. Structural and phase transformations during initial stages of copper condensation on Si(001);Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2011-08
3. Structural and morphological characterisation of hybrid Cu/Si(001) structures;Surface Science;2007-03
4. Hydrogen termination following Cu deposition on Si(001);Physical Review B;2005-04-08
5. SURFACE STRUCTURES AND GROWTH MODES FOR Cu ON Si(100), (110) AND (111) SURFACES DEPENDING ON Cu SEGREGATION BY HEAT TREATMENT;Surface Review and Letters;1996-06
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