The theoretical and experimental study of the ionization processes during the low energy ion sputtering
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference16 articles.
1. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
2. Velocity Filtering for Secondary Ion Quadrupole Mass Spectrometer
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5. Collisions of Ar+ ions with surface Cu atoms and charge exchange of scattered ions near the metal surface
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