Velocity Filtering for Secondary Ion Quadrupole Mass Spectrometer
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1686398
Reference7 articles.
1. Tandem Mass Spectrometer for Secondary Ion Studies
2. An Analytical System for Secondary Ion Mass Spectrometry in Ultra High Vacuum
3. Progress in analytic methods for the ion microprobe mass analyzer
4. Progress in analytic methods for the ion microprobe mass analyzer
5. SECONDARY ION EMISSION
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Chapter 1 Secondary Ion Mass Spectrometry (S.I.M.S.);Progress in Crystal Growth and Characterization;1984-01
2. Surface Spectroscopy Using High Energy Heavy Ions;IEEE Transactions on Nuclear Science;1983
3. Measurement of the Energy Distributions of Secondary Ions from Pure Metals and Alloys;Japanese Journal of Applied Physics;1981-08
4. Transmission d'un filtre de masse quadrupolaire. II. Calcul de la transmission globale d'un spectromètre quadrupolaire;Revue de Physique Appliquée;1980
5. The adsorption of CO on molybdenum studied by low energy SIMS and EID;Surface Science;1978-02
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