Relative sensitivity factors for quantitative Auger analysis of binary alloys
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference32 articles.
1. Selected area and in-depth auger analysis of thin films
2. General formalism for quantitative Auger analysis
3. Relative sputtering yields and quantitative surface analysis by Auger spectroscopy
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