XPS study of lead on SiOx/Si: temperature and light effects
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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3. Band-Bending at Buried SiO2/Si Interface as Probed by XPS;ACS Applied Materials & Interfaces;2013-06-17
4. Communication: Enhancement of dopant dependent x-ray photoelectron spectroscopy peak shifts of Si by surface photovoltage;The Journal of Chemical Physics;2011-10-14
5. (Pb1xCdx)S Nanoparticles Embedded in a Conjugated Organic Matrix, as Studied by Photoluminescence and Light-Induced X-ray Photoelectron Spectroscopy;Advanced Functional Materials;2002-10-16
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