Contrast and resolution in REM, SEM and SAM-Reference-Cited by-同舟云学术

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Contrast and resolution in REM, SEM and SAM

Published:1993-12 Issue:2-3 Volume:298 Page:456-467
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Cowley J.M.,Liu J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference37 articles.

1. Reflection High-Energy Electron Diffraction and Reflection Electron Imaging,1988

2. Resolution limitation in the electron microscopy of surfaces

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