On the information depth of auger electron appearance potential spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference7 articles.
1. A modification of the AEAPS method
2. On the deexcitation mechanism in Auger electron appearance potential spectroscopy
3. A model of processes determining the intensity of DAPS and AEAPS signals
4. Comparison of escape depths between Auger electron and disappearance potential spectroscopy electron
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures;Analytical Sciences;2010
2. Experimental Comparison of the Information Depth of AEAPS, DAPS and AES;Acta Physica Polonica A;1992-02
3. The backscattering factor in appearance potential spectroscopy;Surface Science;1990-12
4. Information depth of Auger electron and appearance potential spectroscopies: a Monte Carlo study;Surface Science;1990-06
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