The backscattering factor in appearance potential spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference21 articles.
1. Low Energy Electrons and Surface Chemistry;Ertl,1985
2. Study of the 4f-levels in rare earths by appearance potential spectroscopy
3. A Soft X‐Ray Appearance Potential Spectrometer for the Analysis of Solid Surfaces
4. Difference in the CrL3L2Intensity Ratio Measured by Soft-X-Ray and Auger-Electron Appearance-Potential Spectroscopy
5. The quest for universal curves to describe the surface sensitivity of electron spectroscopies
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures;Analytical Sciences;2010
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