Study of the (7 × 7) ↔ (1 × 1) Si(111) surface transition by spectroscopic ellipsometry near the pseudo-Brewster angle
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference26 articles.
1. Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
2. Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfaces
3. LEEM investigations of the domain growth of the (7×7) reconstruction on Si(111)
4. Monoatomic step clustering during superstructural transitions on Si(111) surface
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Monitoring of CdTe atomic layer epitaxy using in-situ spectroscopic ellipsometry;Journal of Electronic Materials;1998-06
2. Experimental results from spectroscopic ellipsometry on the (7 × 7)Si(111) surface reconstruction: dielectric function determination;Surface Science;1995-11
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