Experimental results from spectroscopic ellipsometry on the (7 × 7)Si(111) surface reconstruction: dielectric function determination
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference28 articles.
1. Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
2. Study of the (7 × 7) ↔ (1 × 1) Si(111) surface transition by spectroscopic ellipsometry near the pseudo-Brewster angle
3. Photoemission and energy loss spectroscopy on semiconductor surfaces
4. Dispersion of the dangling-bond surface states of Si(111)-(7×7)
5. Reflectometric study of dangling-bond surface states and oxygen adsorption on the clean Si(111)7 × 7 surface
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ellipsometry as a high-precision technique for subnanometer-resolved monitoring of thin-film structures;Nanotechnologies in Russia;2009-04
2. Resonant surface-state transitions of Si(111)-7×7 measured with two-photon photoemission spectroscopy;Physical Review B;2002-01-16
3. STM light emission from Si(1 1 1)-(7 × 7) surface using a silver tip;Applied Surface Science;2001-01
4. Surface-state transitions of Si(111)-7×7 probed using nonlinear optical spectroscopy;Physical Review B;2000-02-15
5. Photon Emission fromSi(111)-(7×7)Induced by Scanning Tunneling Microscopy: Atomic Scale and Material Contrast;Physical Review Letters;1998-08-31
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