Author:
Dutoit M.,Fazan P.,Benjelloun A.,Ilegems M.,Moret J.-M.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference8 articles.
1. ECS Fall Meeting;Fazan,1986
2. Dielectric breakdown in electrically stressed thin films of thermal SiO2
3. MOSFET degradation due to stressing of thin oxide
4. P. Fazan, M. Dutoit, C. Martin and M. Ilegems, Solid-State Electron., to be published.
Cited by
18 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献