Plan-view Si(111) samples for surface science and TEM studies-Reference-Cited by-同舟云学术

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Plan-view Si(111) samples for surface science and TEM studies

Published:1993-09 Issue:1 Volume:72 Page:79-88
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hanbücken M.,Vianey I.,Degiovanni A.,Jourdan C.,Röttger B.,Kliese R.,Neddermeyer H.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference22 articles.

1. A Controlled Method Of Preparing Plan-View Silicon Samples For Transmission Electron Microscopy Studies

2. Simple Plan View Specimen Preparation Technique For Tem Investigation Of Semiconductors and Metals

3. "Surface Dislocation" Process for Surface Reconstruction and Its Application to the Silicon (111) 7×7 Reconstruction

4. Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction

5. UHV electron microscope and diffraction analyses of the structure formed by Pd ON Si(111)7 × 7

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1. Functionalisation through periodically arranged nanostructures;International Journal of Nanotechnology;2012

2. AAO-based nanoreservoir arrays: A quick and easy support for TEM characterization;EPL (Europhysics Letters);2010-12-01

3. Selective functionalization of substrates through assembled nanostructures: From physics to biology;Applied Surface Science;2009-10

4. BEN-HFCVD diamond nucleation on Si(111) investigated by HRTEM and nanodiffraction;Diamond and Related Materials;2005-02

5. Comparison of classical and BEN nucleation studied on thinned Si (1 1 1) samples: a HRTEM study;Applied Surface Science;2003-05

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