Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method

Author:

Suzuki Eiichi,Hayashi Yutaka

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference8 articles.

1. High Efficiency Silicon Solar Cells;Green,1987

2. Semiconductor Material and Device Characterization;Schroder,1990

3. The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties;Orton,1990

4. A method of determining the lifetime and diffusion coefficient of minority carriers in a semiconductor wafer

5. A measurement of a minority‐carrier lifetime in ap‐type silicon wafer by a two‐mercury probe method

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