A general procedure for extracting quantitative depth information from take-off-angle-resolved XPS and AES
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference19 articles.
1. Deconvolution of concentration depth profiles from angle resolved x‐ray photoelectron spectroscopy data
2. A model for determining the composition of layer structured samples using XPS electron take-off angle experiments
3. A comparison of two angular dependent ESCA algorithms useful for constructing depth profiles of surfaces
4. Relative intensities in ESCA and quantitative depth profiling
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