Relative intensities in ESCA and quantitative depth profiling-Reference-Cited by-同舟云学术

Relative intensities in ESCA and quantitative depth profiling

Published:1988-01 Issue: Volume:47 Page:1-25
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Nefedov V.I.,Baschenko O.A.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. ESCA — Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy;Siegbahn;Nova Acta Regiae Soc. Sci. Ups. IV,1967

2. Sensitivity of detection of the elements by photoelectron spectrometry

3. Relative intensities and widths of X-ray induced photo-electron signals from different shells in 72 elements

4. Relative intensities in x-ray photoelectron spectra

Cited by 66 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface and interface properties of La2/3Sr1/3MnO3 thin films on SrTiO3 (001);Physical Review Materials;2019-04-22

2. Coherent growth of oxide films on a cleaved layered metal oxide substrate;Physical Review Materials;2018-10-18

3. Cation profiling of passive films on stainless steel formed in sulphuric and acetic acid by deconvolution of angle-resolved X-ray photoelectron spectra;Applied Surface Science;2013-11

4. Orientation and mutual location of ions at the surface of ionic liquids;Physical Chemistry Chemical Physics;2010

5. Comment on “Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system” by S.V. Merzlikin et al. [Surf. Sci. 602 (2008) 755];Surface Science;2008-12