VEPFIT applied to depth profiling problems-Reference-Cited by-同舟云学术

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VEPFIT applied to depth profiling problems

Published:1995-01 Issue: Volume:85 Page:216-224
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

van Veen A.,Schut H.,Clement M.,de Nijs J.M.M.,Kruseman A.,IJpma M.R.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference20 articles.

1. Extension of the PC version of VEPFIT with input and output routines running under Windows

2. Study of SiO2‐Si and metal‐oxide‐semiconductor structures using positrons

3. Metal/oxide/semiconductor interface investigated by monoenergetic positrons

4. Positron Beams for Solids and Surfaces;van Veen,1990

5. Positron implantation profiles in elemental and multilayer systems

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