Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells-Reference-Cited by-同舟云学术

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Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells

Published:1984-08 Issue:3 Volume:12 Page:329-335
ISSN:0379-6787
Container-title:Solar Cells
language:en
Short-container-title:Solar Cells

Author:

Yacobi B.G.,McMahon T.J.,Madan A.

Publisher

Elsevier BV

Subject

General Engineering

Reference6 articles.

1. Quantitative Scanning Electron Microscopy;Holt,1974

2. Charge collection scanning electron microscopy

3. Defects in bombarded amorphous silicon

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