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Observability solutions for in-field functional test of processor-based systems: A survey and quantitative test case evaluation

  • Published:2016-11 Issue: Volume:47 Page:392-403
  • ISSN:0141-9331
  • Container-title:Microprocessors and Microsystems
  • language:en
  • Short-container-title:Microprocessors and Microsystems

Author:

Perez Acle J.ORCID,Cantoro R.ORCID,Sanchez E.,Sonza Reorda M.,Squillero G.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software

Reference40 articles.

1. Microprocessor software-based self-testing;Psarakis;IEEE Des. Test Comput.,2010

2. Automatic test programs generation driven by internal performance counters;Lindsay,2004

3. On the impact of performance faults in modern microprocessors;Karimi;J. Electron. Test,2013

4. A methodology for detecting performance faults in microprocessors via performance monitoring hardware;Hatzimihail,2007

5. Software-based self test methodology for on-line testing of L1 caches in multithreaded multicore architectures,;Theodorou;IEEE Trans. Very Large Scale Integration (VLSI) Syst.,2013

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1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

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3. Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25

4. A Compaction Method for STLs for GPU in-field test;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14

5. Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement;2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS);2021-06-28
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