Author:
Julien Scott E.,Kempe Michael D.,Eafanti Joshua J.,Morse Joshua,Wang Yu,Fairbrother Andrew,Napoli Sophie,Hauser Adam W.,Ji Liang,O’Brien Gregory S.,Gu Xiaohong,French Roger H.,Bruckman Laura S.,Wan Kai-tak,Boyce Kenneth P.
Funder
U.S. Department of Energy
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference32 articles.
1. Commonly observed degradation in field-aged photovoltaic modules;Quintana,2002
2. Analysis of degradation mechanisms of crystalline silicon PV modules after 12 years of operation in Southern Europe;Sánchez-Friera;Prog. Photovolt., Res. Appl.,2011
3. A comparison of key PV backsheet and module performance from fielded module exposures and accelerated tests;Gambogi;IEEE J. Photovolt.,2014
4. Encapsulation and backsheet adhesion metrology for photovoltaic modules;Tracy;Prog. Photovolt., Res. Appl.,2017
5. Defining threshold values of encapsulant and backsheet adhesion for PV module reliability;Bosco,2017
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