Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures-Reference-Cited by-同舟云学术

Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures

Published:2022-10 Issue: Volume:246 Page:111915
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Shi Yifu,Jones Megan E.,Meier Martin S.,Wright Matthew,Polzin Jana-Isabelle,Kwapil Wolfram,Fischer Christian,Schubert Martin C.,Grovenor Chris,Moody Michael,Bonilla Ruy S.^ORCID

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference48 articles.

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3. Ion implantation for poly-Si passivated back-junction back-contacted solar cells;Römer;IEEE J. Photovoltaics,2015

4. Silicon-based passivating contacts: the TOPCon route;Glunz;Prog. Photovoltaics Res. Appl.,2021

5. Laser contact openings for local poly-Si-metal contacts enabling 26.1%-efficient POLO-IBC solar cells;Haase;Sol. Energy Mater. Sol. Cells,2018

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography;Microscopy and Microanalysis;2024-09-03

2. Hydrogen thermal activation of defects enabling firing stable Poly-Si based passivating contacts for TOPCon solar cells;Solar Energy;2024-09

3. Enhancing industrialization TOPCon solar cell efficiency via comprehensive anti-reflection passivation film optimization;Materials Science in Semiconductor Processing;2024-01

4. Field Manipulation of Band Properties in Infrared Spectra of Thin Films;Advanced Photonics Research;2023-11-02