The novel usage of spectroscopic ellipsometry for the development of amorphous Si solar cells-Reference-Cited by-同舟云学术

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The novel usage of spectroscopic ellipsometry for the development of amorphous Si solar cells

Published:2011-01 Issue:1 Volume:95 Page:142-145
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Lee Seung-Yoon,Shim Jenny H.,You Dong Joo,Ahn Seh-won,Lee Heon-Min

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. R.E.I. Schropp, M. Zeman, Optical, Electronic and Structural Properties, in: Amorphous and Microcrystalline Si Solar Cells: Modelling, Materials, and Device Technology, 1998, pp. 41–47.

2. A highly stabilized hydrogenated amorphous silicon film having very low hydrogen concentration and an improved Si bond network;Shimizu;J. Appl. Phys.,2005

3. Highly stabilized hydrogenated amorphous silicon solar cells fabricated by triod-plasma CVD;Sonobe;Thin Solid Films,2006

4. Annealing-induced effects on the stability of hydrogenated amorphous silicon;Schmidt;J. Appl. Phys.,1995

5. Kinetics of silicon film growth and the deposition phase diagram;Ferreira;J. Non-Cryst. Solids,2004

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