Validation of methodology to determine the contact resistivity of ECA-based bonds grounded on end–contact resistance measurements using redundant and modified TLM test structures

Author:

Devoto M. IgnaciaORCID,Wienands Karl,Rudolph DominikORCID,Timofte Tudor,Halm Andreas,Gottschalg Ralph,Tune DanielORCID

Funder

Bundesministerium für Wirtschaft und Klimaschutz

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Influence of micro– and macrostructure when determining the contact resistivity of interconnects based on electrically conductive adhesives;Devoto Acevedo;Sol. Energy Mater. Sol. Cells,2023

2. How to assess the electrical quality of solar cell interconnection in shingle solar modules;Weber;Prog. Photovoltaics Res. Appl.,2023

3. Metal/semiconductor contact resistivity and its determination from contact resistance measurements;Scorzoni;Mater. Sci. Rep.,1988

4. Electrical modelling of Kelvin structures for the derivation of low specific contact resistivity;Reeves;Eur. Solid-State Device Res. Conf.,1997

5. Kelvin test structure modeling of metal-silicide-silicon contacts;Reeves;MRS Proc,1998

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