1. J.F. Lelièvre, Ph.D. Thesis, Insitut des Nanotechnologies de Lyon, INSA de Lyon, France, 2007.
2. Comparative investigation of hydrogen bonding in silicon based PECVD grown dielectrics for optical waveguides;Ay;Optical Materials,2004
3. J. Seiffe, L. Weiss, M. Hofmann, L. Gautero, J. Rentsch, Alternative rear surface passivation for industrial cell production, in: Proceedings of the 23rd European Photovoltaic Solar Energy Conference, Valencia, 2008, pp. 1700–1703.
4. S. Wang, T. Puzzer, B. Vogl, B. Tjahjono, B. Hallam, M. Eadie, N. Borojevic, Z. Hameiri, S. Wenham, Overcoming over-plating problems on acid textured multicrystalline wafers with silicon nitride coated surfaces, in: Proceedings of the 24th European Photovoltaic Solar Energy Conference, Hamburg, 2009, pp. 1449–1552.
5. Impact of PECVD SiON stoichiometry and post-annealing on the silicon surface passivation;Dupuis;Thin Solid Films,2008