Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering-Reference-Cited by-同舟云学术

Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering

Published:2015-12 Issue: Volume:76 Page:66-72
ISSN:0963-8695
Container-title:NDT & E International
language:en
Short-container-title:NDT & E International

Author:

Wang Hongjin,Hsieh Sheng-Jen,Zhou Xunfei,Peng Bo,Singh Bhavana

Publisher

Elsevier BV

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science

Reference49 articles.

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