Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applications-Reference-Cited by-同舟云学术

Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applications

Published:2015-11 Issue: Volume:595 Page:176-180
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Chen Hua-Mao,Chang Ting-Chang,Tai Ya-Hsiang,Chen Kuan-Fu,Chiang Hsiao-Cheng,Liu Kuan-Hsien,Lee Chao-Kuei,Lin Wei-Ting,Cheng Chun-Cheng,Tu Chun-Hao,Liu Chu-Yu

Funder

Ministry of Science and Technology of the People's Republic of China

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

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