Author:
Park Young-Bae,Mönig Reiner,Volkert Cynthia A.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. Electromigration in thin aluminum films on titanium nitride
2. Finite‐element stress analysis of failure mechanisms in a multilevel metallization structure
3. 9th Annual Proceeding of Reliability Physics;Philofsky,1971
4. AIP Proceedings of the 6th International Workshop of Stress Induced Phenomena in Metallization;Keller,2002
5. R. Mönig, Doctoral Thesis, University of Stuttgart, Germany, 2005.
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26 articles.
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