Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO 2−x thin films-Reference-Cited by-同舟云学术

Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO 2−x thin films

Published:2014-11 Issue: Volume:571 Page:23-31
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Bousoulas P.,Michelakaki I.,Tsoukalas D.

Funder

Aristeia II

European Union (European Social Fund ESF)

National Strategic Reference Framework (NSRF)

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

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