Determination of Young's modulus and Poisson's ratio of thin films by X-ray methods-Reference-Cited by-同舟云学术

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Determination of Young's modulus and Poisson's ratio of thin films by X-ray methods

Published:2013-10 Issue: Volume:544 Page:201-205
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Fu Wei-En,Chang Yong-Qing,He Bo-Ching,Wu Chung-Lin

Funder

Bureau of Standards, Metrology and Inspection (BSMI) Nanometer-Scale Metrology Project

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Mechanical properties of thin films

2. Von Mises Stress in Chemical‐Mechanical Polishing Processes

3. Stress distribution in chemical mechanical polishing

4. Determination of thin-film stresses on round substrates

5. Thin Film Materials: Stress, Defect Formation and Surface Evolution;Freund,2004

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2. An improved over-deterministic method for determining Young’s modulus and Poisson’s ratio of materials using specimens with cracks;Engineering Fracture Mechanics;2022-12

3. Application of Air-Coupled Ultrasonic Nondestructive Testing in the Measurement of Elastic Modulus of Materials;Applied Sciences;2021-10-04

4. Elastoplastic and fatigue properties of copper in printed circuit boards: from experimental characterization to numerical simulations;2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2020-07

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