A study on the microstructural and chemical evolution of In–Ga–Zn–O sol–gel films and the effects on the electrical properties-Reference-Cited by-同舟云学术

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A study on the microstructural and chemical evolution of In–Ga–Zn–O sol–gel films and the effects on the electrical properties

Published:2013-07 Issue: Volume:540 Page:31-35
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Jeon Haseok,Song Jury,Na Sekwon,Moon Miran,Lim Junhyung,Joo Jinho,Jung Donggun,Kim Hyungsub,Noh Jinsoo,Lee Hoo-Jeong

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Amorphous In–Ga–Zn–O coplanar homojunction thin-film transistor

2. Comprehensive Study on the Transport Mechanism of Amorphous Indium-Gallium-Zinc Oxide Transistors

3. Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

4. Inkjet-printed InGaZnO thin film transistor

5. Formation Mechanism of Solution-Processed Nanocrystalline InGaZnO Thin Film as Active Channel Layer in Thin-Film Transistor

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Thermal Postdeposition on Trap States in Sol–Gel Indium–Zinc Oxide TFTs;IEEE Transactions on Electron Devices;2022-01

2. Photonic Curing of Solution-Processed Oxide Semiconductors with Efficient Gate Absorbers and Minimal Substrate Heating for High-Performance Thin-Film Transistors;ACS Omega;2021-06-25

3. Improved Performance and Operational Stability of Solution-Processed InGaSnO (IGTO) Thin Film Transistors by the Formation of Sn–O Complexes;ACS Applied Electronic Materials;2021-02-16

4. Solution Processing of Lithium‐Rich Amorphous Li‐La‐Zr‐O Ion Conductor and Its Application for Cycling Durability Improvement of LiCoO 2 Cathode as Coating Layer;Advanced Materials Interfaces;2021-01-12

5. Sol-Jel Yöntemiyle IGZO Partiküllerin Üretimi, Peletlenmesi ve Karakterizasyonu;Journal of Polytechnic;2020-05-22

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