Admittance spectroscopy study of defects in β-Ga2O3-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Admittance spectroscopy study of defects in β-Ga2O3

Published:2024-01 Issue: Volume:789 Page:140196
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Li Jian V.,Hendricks Jessica,Charnas Adam^ORCID,Noesges Brenton A.^ORCID,Neal Adam T.,Asel Thaddeus J.,Kim Yunjo,Mou Shin^ORCID

Funder

Air Force Research Laboratory

Air Force Office of Scientific Research

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Toward gallium oxide power electronics;Tadjer;Science,2022

2. β-Gallium oxide power electronics;Green;APL Mater,2022

3. Point defects in Ga2O3;McCluskey;J. Appl. Phys.,2020

4. Gallium Oxide: Materials Properties, Crystal Growth, and Devices;Higashiwaki,2020

5. Gallium Oxide: Technology, Devices and Applications;Pearton,2019

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP