Ellipsometer analysis in the n–k plane
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of Reflection;McCrakin,1964
3. Numerical ellipsometry: enhancement of new algorithm for real-time, in situ film growth monitoring
4. Numerical ellipsometry: Real‐time solutions using mapping onto the complex index plane
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