Principal component analysis: Reveal camouflaged information in x-ray absorption spectroscopy photoemission electron microscopy of complex thin oxide films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference41 articles.
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4. Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure;Walton;J. Electron Spectrosc. Relat. Phenom.,2005
5. X-PEEM study of antiferromagnetic domain patterns in LaFeO3 thin films and embedded nanostructures;Folven;J. Electron Spectrosc. Relat. Phenom.,2012
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