Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]”
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Published:2021-07
Issue:
Volume:729
Page:138694
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ISSN:0040-6090
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Container-title:Thin Solid Films
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language:en
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Short-container-title:Thin Solid Films
Author:
Giesen Margret,Jugovac Matteo,Zamborlini Giovanni,Feyer Vitaliy,Gunkel Felix,Mueller David N.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials