Author:
Sun Jianing,Tiwald Thomas
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. Spectroscopic Ellipsometry: Principles and Applications;Fujiwara,2007
3. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization;Tompkins,2016
4. Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
5. Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements;Pribil;Thin. Solid. Films,2004
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