Fracture toughness measurement of thin films on compliant substrate using controlled buckling test
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Electronic Thin Film Science — for Electrical Engineers and Materials Scientists;Tu,1992
2. Application of plasma polymerization on ophthalmic lenses: equipment and processes
3. Effect of oxygen concentration in the sputtering ambient on the microstructure, electrical and optical properties of radio-frequency magnetron-sputtered indium tin oxide films
4. Transparent conducting ZnO thin films deposited by vacuum arc plasma evaporation
5. Superhard nanocrystalline composite materials: The TiN/Si3N4 system
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