Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films-Reference-Cited by-同舟云学术

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Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films

Published:2004-05 Issue: Volume:455-456 Page:222-227
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Ihn Y.S.,Kim T.J.,Ghong T.H.,Kim Y.D.,Aspnes D.E.,Kossut J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Growth of MgTe and Cd1−xMgxTe thin films by molecular beam epitaxy

2. Nondestructive analysis of Hg1−xCdxTe (x=0.00, 0.20, 0.29, and 1.00) by spectroscopic ellipsometry. II. Substrate, oxide, and interface properties

3. Ellipsometric studies of electronic interband transitions inCdxHg1−xTe

4. Optical properties of CdTe: Experiment and modeling

5. Ellipsometric studies of the dielectric function ofCd1−xMnxTe alloys

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