Author:
Ferrieu F.,Novikova T.,Fallet C.,Ben Hatit S.,Vannuffel C.,De Martino A.
Funder
French National Agency for Research
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Inverse problem of Mueller polarimetry for metrological applications;Journal of Inverse and Ill-posed Problems;2021-03-25
2. Spectroscopic ellipsometry—A perspective;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2013-09