Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2-Reference-Cited by-同舟云学术

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Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2

Published:2008-04 Issue:12 Volume:516 Page:4277-4281
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Alonso M.I.,Garriga M.,Bernardi A.,Goñi A.R.,Lopeandia A.F.,Garcia G.,Rodríguez-Viejo J.,Lábár J.L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Formation of Ge nanocrystals embedded in aSiO2matrix: Transmission electron microscopy, x-ray absorption, and optical studies

2. Charge storage and photoluminescence characteristics of silicon oxide embedded Ge nanocrystal trilayer structures

3. Investigation of Ge nanocrystal formation in SiO 2 -Ge-SiO 2 sandwich structure

4. Nanocalorimetric high-temperature characterization of ultrathin films of a-Ge

5. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectro-ellipsometric probing of wetting, nucleation, and dot/island formation during photo-excited chemical vapor deposition of Ge on SiO₂ substrate;Journal of Vacuum Science & Technology B;2022-12

2. Spectro-ellipsometric modeling and optimization of two-dimensional Ge layer and three-dimensional Ge dot/island structures on SiO2 substrates;Japanese Journal of Applied Physics;2021-01-01

3. ZnO-Ge MULTILAYER THIN FILM STRUCTURES DEPOSITED BY THERMAL EVAPORATION TECHNIQUE;Surface Review and Letters;2019-09-10

4. Real-time spectro-ellipsometric approach to distinguish between two-dimensional Ge layer growth and Ge dot formation on SiO2 substrates;Applied Surface Science;2018-04

5. Production of three-dimensional quantum dot lattice of Ge/Si core–shell quantum dots and Si/Ge layers in an alumina glass matrix;Nanotechnology;2015-01-21

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