Energy band alignment at interfaces of semiconducting oxides: A review of experimental determination using photoelectron spectroscopy and comparison with theoretical predictions by the electron affinity rule, charge neutrality levels, and the common anion rule-Reference-Cited by-同舟云学术

Energy band alignment at interfaces of semiconducting oxides: A review of experimental determination using photoelectron spectroscopy and comparison with theoretical predictions by the electron affinity rule, charge neutrality levels, and the common anion rule

Published:2012-03 Issue:10 Volume:520 Page:3721-3728
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Klein Andreas

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference127 articles.

1. Transparent Conductive Zinc Oxide: Basics and Applications in Thin Film Solar Cells;Klein,2008

2. Interface Engineering of Inorganic Thin-Film Solar Cells - Materials-Science Challenges for Advanced Physical Concepts

3. Energy Level Alignment and Interfacial Electronic Structures at Organic/Metal and Organic/Organic Interfaces

4. Transparent Oxide Semiconductors: Fundamentals and Recent Progress,2010

5. Nanoelectronics and Information Technology,2003

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