Probing Semiconductor Properties with Optical Scanning Tunneling Microscopy-Reference-Cited by-同舟云学术

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Probing Semiconductor Properties with Optical Scanning Tunneling Microscopy

Published:2020-03 Issue:3 Volume:4 Page:524-538
ISSN:2542-4351
Container-title:Joule
language:en
Short-container-title:Joule

Author:

Wieghold Sarah,Nienhaus Lea

Funder

Florida State University

Publisher

Elsevier BV

Subject

General Energy

Reference171 articles.

1. There’s plenty of room at the bottom;Feynman;Eng. Sci.,1960

2. Introduction to Scanning Tunneling Microscopy;Chen,1994

3. Scanning tunneling microscopy;Binnig;Helv. Phys. Acta,1982

4. Surface studies by scanning tunneling microscopy;Binnig;Phys. Rev. Lett.,1982

5. 7 × 7 Reconstruction on Si(111) resolved in real space;Binnig;Phys. Rev. Lett.,1983

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1. Atomic-scale terahertz time-domain spectroscopy;Nature Photonics;2024-07-04

2. Nanoscale Examination of Artistic Surfaces Utilizing 3D Non-Contact Optical Scanning Technology;Journal of Nanoelectronics and Optoelectronics;2024-01-01

3. Scanning probe microscope;Non-Destructive Material Characterization Methods;2024

4. Viewing Optical Processes at the Nanoscale: Combining Scanning Tunneling Microscopy and Optical Spectroscopy;The Journal of Physical Chemistry C;2023-02-21

5. Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors;ACS Nano;2023-02-03

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