Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors-Reference-Cited by-同舟云学术

Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors

Published:2023-02-03 Issue:4 Volume:17 Page:3645-3656
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Yannai Michael¹^ORCID,Dahan Raphael¹,Gorlach Alexey¹,Adiv Yuval¹^ORCID,Wang Kangpeng¹,Madan Ivan²^ORCID,Gargiulo Simone²^ORCID,Barantani Francesco²³^ORCID,Dias Eduardo J. C.⁴,Vanacore Giovanni Maria⁵^ORCID,Rivera Nicholas⁶^ORCID,Carbone Fabrizio²,García de Abajo F. Javier⁴⁷^ORCID,Kaminer Ido¹^ORCID

Affiliation:

1. Technion - Israel Institute of Technology, Haifa 3200003, Israel

2. Institute of Physics, École Polytechnique Fédérale de Lausanne, Station 6, Lausanne 1015, Switzerland

3. Department of Quantum Matter Physics, University of Geneva, 24 Quai Ernest-Ansermet, 1211 Geneva 4, Switzerland

4. ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Barcelona, Spain

5. Department of Materials Science, University of Milano-Bicocca, Via Cozzi 55, 20121 Milano, Italy

6. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

7. ICREA-Institució Catalana de Recerca i Estudis Avançats, Passeig Lluís Companys 23, 08010 Barcelona, Spain

Funder

Fundaci?n Cellex

FUNDACI? Privada MIR-PUIG

Ministerio de Ciencia e Innovaci?n

H2020 Future and Emerging Technologies

Centres de Recerca de Catalunya

H2020 European Research Council

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c10481

Reference77 articles.

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