Defect Analysis: Basic Techniques for Management and Learning-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Defect Analysis: Basic Techniques for Management and Learning

Published:2005 Issue: Volume: Page:259-295
ISSN:0065-2458
Container-title:Advances in Computers
language:
Short-container-title:

Author:

Card David N.

Publisher

Elsevier

Reference52 articles.

1. A methodology for collecting valid software engineering data;Basili;IEEE Transactions on Software Engineering,1984

2. The Practice of Social Research;Babbie,1986

3. In-process improvement through defect data interpretation;Bhandari;IBM Systems Journal,1994

4. Orthogonal defect classification using defect data to improve software development;Bridge;ASQ Software Quality Newsletter,1998

5. Statistical Methods for Software Quality;Burr,1996

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Process Improvement Using the Scientific Method;Communications in Computer and Information Science;2023

2. Model for Analyzing the Critical Variables of an Industrial Process Using Fuzzy Inference System and Likert Scale;Arabian Journal for Science and Engineering;2021-11-30

3. The ProcessPAIR Method for Automated Software Process Performance Analysis;IEEE Access;2020

4. Causal Analysis and Resolution with Theory of Constraints;Proceedings of the 17th Brazilian Symposium on Software Quality;2018-10-17

5. Supporting defect causal analysis in practice with cross-company data on causes of requirements engineering problems;2017 IEEE/ACM 39th International Conference on Software Engineering: Software Engineering in Practice Track (ICSE-SEIP);2017-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP