In-process improvement through defect data interpretation-Reference-Cited by-同舟云学术

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In-process improvement through defect data interpretation

Published:1994 Issue:1 Volume:33 Page:182-214
ISSN:0018-8670
Container-title:IBM Systems Journal
language:
Short-container-title:IBM Syst. J.

Author:

Bhandari I.,Halliday M. J.,Chaar J.,Chillarege R.,Jones K.,Atkinson J. S.,Lepori-Costello C.,Jasper P. Y.,Tarver E. D.,Lewis C. C.,Yonezawa M.

Publisher

IBM

Subject

Computational Theory and Mathematics,Computer Graphics and Computer-Aided Design,Information Systems,General Computer Science,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx5/5288519/5387343/05387345.pdf?arnumber=5387345

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Are vulnerabilities discovered and resolved like other defects?;Empirical Software Engineering;2017-09-19

2. Testing techniques selection based on ODC fault types and software metrics;Journal of Systems and Software;2013-06

3. Identifying Process Problems with the SAWO Functional Defect Classification Scheme;Communications in Computer and Information Science;2013

4. Impact of HRM policies on quality assurance under requirement volatility;International Journal of Quality & Reliability Management;2012-01-20

5. Defect Data Analysis as Input for Software Process Improvement;Product-Focused Software Process Improvement;2012

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