Statistical scaling of C and O K-shell fluorescence yields

Author:

Bissinger G.,Joyce J.M.,Tanis J.A.,Varghese S.L.

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Particle-induced X-ray emission of light elements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-08

2. K X-ray yield of sulfur in H2S and SF6 from photoionization;Physics Letters A;1988-03

3. Additivity of k X-ray yield of chlorine in CHClF2, CCl2F2, C2Cl2F4, and CCl3F;Journal of Electron Spectroscopy and Related Phenomena;1988-01

4. Effect of the molecular environment on the C, N, and O Auger-electron yields induced by MeVH+andHe+ions;Physical Review A;1987-10-01

5. CarbonK-shell x-ray and Auger-electron production in hydrocarbons and carbon oxides by 0.6–2.0-MeV protons;Physical Review A;1987-05-01

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