Particle-induced X-ray emission of light elements-Reference-Cited by-同舟云学术

Particle-induced X-ray emission of light elements

Published:1991-08 Issue:2 Volume:61 Page:213-220
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Willemsen M.F.C.,Kuiper A.E.T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference30 articles.

1. PIXE, a Novel Technique for Elemental Analysis;Johansson,1988

2. Proc. of the 5th International Conference on PIXE and its Analytical Applications,1990

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Low energy PIXE: advantages, drawbacks, and applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09

2. Influence of energy straggling on quantitative PIXE analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

3. Analysis of light elements with a nuclear microprobe — A review;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09

4. Quantitative PIXE microanalysis of thick specimens;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-05