Surface structure reflectometry with X-rays-Reference-Cited by-同舟云学术

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Surface structure reflectometry with X-rays

Published:1996-10 Issue:5 Volume:1 Page:645-652
ISSN:1359-0286
Container-title:Current Opinion in Solid State and Materials Science
language:en
Short-container-title:Current Opinion in Solid State and Materials Science

Author:

Sinha Sunil K

Publisher

Elsevier BV

Subject

General Materials Science

Reference98 articles.

1. Scattering of X-rays and neutrons at interfaces;Dietrich;Phys Rep-Rev Sect Phys Lett,1995

2. Glancing-incidence X-ray-analysis of thin-layered materials: a review;DeBoer;X-Ray Spectrom.,1995

3. Grazing-incidence surface scattering of X-rays;Daillant;J Chem Soc-Faraday Trans,1996

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Reflectometry Study of the State of the Surface Layer of Polished Silicon Substrates Depending on the Methods of Their Cleaning;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2021-09

2. Observing structural reorientations at solvent–nanoparticle interfaces by X-ray diffraction – putting water in the spotlight;Acta Crystallographica Section A Foundations and Advances;2016-10-06

3. Densification of amorphous sol–gel TiO2 films: An X-ray reflectometry study;Thin Solid Films;2010-05

4. Temperature dependence of surface layering in a dielectric liquid;Physical Review B;2007-07-24

5. Liquid–vapor density profiles from equilibrium limit of diffusion equation for interacting particles;Journal of Colloid and Interface Science;2007-03

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