An XPS and ISS investigation of passive layers on binary Fe-Al alloys
Author:
Publisher
Elsevier BV
Subject
General Materials Science,General Chemical Engineering,General Chemistry
Reference24 articles.
1. Compositional changes of passive films due to different transport rates and preferential dissolution
2. XPS and ISS examinations of electrode surfaces and passive layers with a specimen transfer in a closed system
3. Anodic oxide films. Influence of the film present before anodization
4. Quantitative evaluation of AES-depth profiles of thin anodic oxide films (Ta2O5/Ta, Nb2O5/Nb)
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