Interface Control Processes for Ni/Ge and Pd/Ge Schottky and Ohmic Contact Fabrication: Part Two
Author:
Publisher
InTech
Link
http://www.intechopen.com/download/pdf/62485
Reference15 articles.
1. Brunco DP, De Jaeger B, Eneman G, Mitard J, Hellings G, Satta A, Terzieva V, Souriau L, Leys FE, Pourtois G, Houssa M, Winderickx G, Vrancken E, Sioncke S, Opsomer K, Nicholas G, Caymax M, Stesmans A, Van Steenbergen J, Mertens PW, Meuris M, Heyns MM. Germanium MOSFET Devices: Advances in Materials Understanding, Process Development, and Electrical Performance. Journal of the Electrochemical Society. 2008;155(7):H552-H561
2. Gaudet S, Detavernier C, Kellock AJ, Desjardins P, Lavoie C. Thin film reaction of transition metals with germanium. Journal of Vacuum Science and Technology. 2006;A24:474
3. Jin LJ, Pey KL, Choi WK, Fitzgerald EA, Antoniadis DA, Pitera AJ, Lee ML, Chi DZ, Tung CH. The interfacial reaction of Ni with (111)Ge, (100)Si0.75Ge 0.25 and (100)Si at 400 °C. Thin Solid Films. 2004;462-463:151-155
4. Nemouchi F, Mangelinck D, Bergman C, Clugnet G, Gas P. Simultaneous growth of Ni5Ge3 and NiGe by reaction of Ni film with Ge. Applied Physics Letters. 2006;89:131920
5. Patterson JK, Park BJ, Ritley K, Xiao HZ, Allen LH, Rockett A. Kinetics of Ni/a-Ge bilayer reactions. Thin Solid Films. 1994;253(1-2):456-461
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. High pressure phase stability, elastic anisotropy and electronic properties of GePd;Materials Science in Semiconductor Processing;2022-02
2. Electrical Characterization of Germanium Nanowires Using a Symmetric Hall Bar Configuration: Size and Shape Dependence;Nanomaterials;2021-10-30
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3